Semiconductor Metrology Instruments Suppliers in Deer Park, New York

Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.   (more)
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Lorlin Test Systems, Inc.
Address: 87 E. Jefryn Blvd., Deer Park, NY 11729 United States
Business Type: Manufacturer, Service

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